DM8000 M & DM12000 M

Improve your decision-making for product quality and save time by gaining deeper insights into samples with the DM8000 M and DM12000 M optical inspection systems.

Inspection, process control and defect analysis of wafers or LCDs and TFTs has to be fast, accurate and ergonomic. Leica Microsystems has many years of experience in developing inspection systems for the semiconductor industry. Using this expertise, we have developed a totally new line of products for the inspection of 8 and 12 inch wafers.